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	1.		Image from Amazon.com	Nanoscale processes on insulating surfaces [electronic resource] / Enrico Gnecco, Marek Szymonski. by Gnecco, Enrico Szymo�nski, Marek ebrary, Inc Publication details: Singapore ; Hackensack, N.J. : World Scientific, c2009 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	2.		Image from Amazon.com	Scanning probe microscopy [electronic resource] / editors, Nikodem Tomczak, Kuan Eng Johnson Goh. by Tomczak, Nikodem Goh, Kuan Eng Johnson ebrary, Inc Publication details: Singapore ; Hackensack, N.J. : World Scientific Pub. Co., 2011 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	3.		Image from Amazon.com	Instrumental community [electronic resource] : probe microscopy and the path to nanotechnology / Cyrus C. M. Mody. by Mody, Cyrus C. M. (Cyrus Cawas Maneck), 1974- ebrary, Inc Series: Inside technology Publication details: Cambridge, Mass. : MIT Press, 2011 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	4.		Image from Amazon.com	Scanning probe microscopy of soft matter [electronic resource] : fundamentals and practices / by Vladimir V. Tsukruk and Srikanth Singamaneni. by �T�Sukruk, V. V. (Vladimir Vasil�evich) Singamaneni, Srikanth ebrary, Inc Publication details: Weinheim : Wiley-VCH, c2012 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	5.		Image from Amazon.com	Scanning probe microscopy for energy research [electronic resource] / editors, Dawn A. Bonnell, Sergei V. Kalinin. by Bonnell, Dawn A Kalinin, Sergei V ebrary, Inc Series: World Scientific series in nanoscience and nanotechnology ; v. 7. Publication details: [Hackensack] N.J. : World Scientific, c2013 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	6.		Image from Amazon.com	Scanning probe microscopy for industrial applications : nanomechanical characterization / edited by Dalia G. Yablon. by Yablon, Dalia G, 1975- ebrary, Inc Publisher: Hoboken, New Jersey : Wiley, 2014Copyright date: �2014 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	7.		Image from Amazon.com	Scanning probe microscopy in industrial applications : nanomechanical characterization / edited by Dalia G. Yablon. by Yablon, Dalia G, 1975- [editor.] Wiley eBooks Publisher: Hoboken, New Jersey : Wiley, [2014] Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	8.		Image from Amazon.com	Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology. by Klapetek, Petr ScienceDirect eBooks Series: Micro & nano technologies2012 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	9.		Image from Amazon.com	Local probe techniques for corrosion research / edited by R. Oltra [and three others]. by Oltra, R ScienceDirect eBooks Series: Woodhead Publishing in materials \| Publications (European Federation of Corrosion) ; no. 45.Publisher: Cambridge, England ; Boca Raton, Florida : Woodhead Publishing Limited : CRC Press, 2007Copyright date: ©2007 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)

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