000 04701cam a2200721Ia 4500
001 ocn802056597
003 OCoLC
005 20161030160646.0
006 m o d
007 cr cn|||||||||
008 111011s2012 njuad ob 001 0 eng d
010 _z 2011042405
040 _aE7B
_beng
_epn
_cE7B
_dN$T
_dDG1
_dCDX
_dOCLCO
_dYDXCP
_dOCLCQ
_dDEBSZ
_dOCLCQ
_dIEEEE
_dZMC
_dCOO
_dMYG
_dUMI
_dB24X7
_dOCLCQ
_dRECBK
_dFTU
_dOCLCF
_dOCLCQ
_dEBLCP
_dOCLCQ
_dCAUOI
019 _a806520921
_a828691390
_a898985672
_a960143714
020 _a9781118310052
_q(electronic bk.)
020 _a1118310055
_q(electronic bk.)
020 _a9781118309995
_q(electronic bk.)
020 _a1118309995
_q(electronic bk.)
020 _a9781118310038
_q(electronic bk.)
020 _a1118310039
_q(electronic bk.)
020 _z9780470486757
_q(Cloth)
020 _z0470486759
_q(Cloth)
024 8 _a9786613719874
028 0 1 _aEB00063319
_bRecorded Books
029 1 _aAU@
_b000050768071
029 1 _aDEBBG
_bBV041121211
029 1 _aDEBBG
_bBV041828950
029 1 _aDEBSZ
_b372815901
029 1 _aDEBSZ
_b377426857
029 1 _aDEBSZ
_b396761399
029 1 _aDKDLA
_b820120-katalog:000599721
029 1 _aNZ1
_b14695654
029 1 _aNZ1
_b15340903
035 _a(OCoLC)802056597
037 _a371987
_bMIL
050 4 _aTA169
_b.D47 2012
049 _aAlfaisal Main Library
245 0 0 _aDesign for reliability /
_cedited by Dev Raheja, Louis J. Gullo.
260 _a[Piscataway, N.J.] ;
_aIEEE Press ;
_aHoboken, N.J. :
_bWiley,
_c©2012.
300 _a1 online resource (xxiii, 308 pages) :
_billustrations.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
490 1 _aWiley series in quality & reliability engineering
504 _aIncludes bibliographical references and index.
505 0 0 _tIntroduction: What You Will Learn --
_g1.
_tDesign for Reliability Paradigms /
_rDev Raheja --
_g2.
_tReliability Design Tools /
_rJoseph A. Childs --
_g3.
_tDeveloping Reliable Software /
_rSamuel Keene --
_g4.
_tReliability Models /
_rLouis J. Gullo --
_g5.
_tDesign Failure Modes, Effects, and Criticality Analysis /
_rLouis J. Gullo --
_g6.
_tProcess Failure Modes, Effects, and Criticality Analysis /
_rJoseph A. Childs --
_g7.
_tFMECA Applied to Software Development /
_rRobert W. Stoddard --
_g8.
_tSix Sigma Approach to Requirements Development /
_rSamuel Keene --
_g9.
_tHuman Factors in Reliable Design /
_rJack Dixon --
_g10.
_tStress Analysis During Design to Eliminate Failures /
_rLouis J. Gullo --
_g11.
_tHighly Accelerated Life Testing /
_rLouis J. Gullo --
_g12.
_tDesign for Extreme Environments /
_rSteven S. Austin --
_g13.
_tDesign for Trustworthiness /
_rLawrence Bernstein and C.M. Yuhas --
_g14.
_tPrognostics and Health Management Capabilities to Improve Reliability /
_rLouis J. Gullo --
_g15.
_tReliability Management /
_rJoseph A. Childs --
_g16.
_tRisk Management, Exception Handling, and Change Management /
_rJack Dixon --
_g17.
_tIntegrating Design for Reliability with Design for Safety /
_rBrian Moriarty --
_g18.
_tOrganizational Reliability Capability Assessment /
_rLouis J. Gullo.
520 _a"The aim of Design for Reliability (DFR) is to design for zero failures of critical system functions, which results in enormous savings in life cycle costs for producers and users. This practical guide helps readers to understand the best-of-breed methods, technologies, and tools for incorporating reliability into the complex systems design process. A significant feature of the book is the integration of ideas from computer science and market engineering. By adopting these design principles and learning from "insight" panels, engineers and managers will improve their ability to compete in global markets"--
_cProvided by publisher.
590 _aJohn Wiley and Sons
_bWiley eBooks
650 0 _aReliability (Engineering)
650 4 _aReliability (Engineering)
650 7 _aTECHNOLOGY & ENGINEERING
_xQuality Control.
_2bisacsh
650 7 _aReliability (Engineering)
_2fast
_0(OCoLC)fst01093646
655 7 _aElectronic books.
_2local
700 1 _aRaheja, Dev,
_eeditor.
700 1 _aGullo, Louis J.,
_eeditor.
710 2 _aWiley eBooks.
776 0 8 _iPrint version:
_tDesign for reliability.
_dHoboken, N.J. : Wiley : IEEE Press, ©2012
_z9780470486757
_w(DLC) 2011042405
_w(OCoLC)760293740
830 0 _aWiley series in quality and reliability engineering.
856 4 0 _uhttp://ezproxy.alfaisal.edu/login?url=http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791
856 4 0 _uhttp://ezproxy.alfaisal.edu/login?url=http://dx.doi.org/10.1002/9781118310052
942 _2lcc
_cEBOOKS
994 _a92
_bSAAFU
999 _c473033
_d473033