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Testing for small-delay defects in nanoscale CMOS integrated circuits / edited by Sandeep K. Goel, Krishnendu Chakrabarty. by Series: Devices, circuits, and systemsPublisher: Boca Raton, FL : CRC Press, [2014]Copyright date: (copy)2014
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  • Testing for small-delay defects in nanoscale Complementary Metal-Oxide Semiconductor integrated circuits
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